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Title: De-embedding and Modelling of pnp SiGe HBTs
Type: Article in proceedingsArticle in proceedings
Participant(s):
Author:  Hadziabdic, Dzenan (Cwisno: 18578)
Technical University of Denmark

Author:  Jiang, Chenhui (Cwisno: 19033)
Technical University of Denmark

Author:  Johansen, Tom Keinicke (Cwisno: 6153)
Technical University of Denmark
Email:

Forfatter:  Fischer, G.G.
Im Technologiepark 25, D-15236 Frankfurt (Oder), Germany, IHP

Forfatter:  Heinemann, B.
Im Technologiepark 25, D-15236 Frankfurt (Oder), Germany, IHP

Author:  Krozer, Viktor (Cwisno: 12227)
Technical University of Denmark
Abstract: In this work we present a direct parameter extraction procedure for SiGe pnp heterojunction bipolar transistor (HBT) large-signal and small-signal models. Test structure parasitics are removed from the measured small-signal parameters using an open-short de-embedding technique, improved to account for the distributed nature of the interconnect lines. Good agreement is achieved between the small-signal model of the HBT and the measurements. Parameters for the large-signal VBIC model are extracted based on multi-bias small-signal model extraction, leading to consistency between measured and modeled fBTB.
Published: part of: Proceedings of the 2nd European Microwave Integrated Circuits Conference (ISBN: 978-2-87487-002-6), pages: 195-198, 2007, IEEE,
DOI:
File(s):
Presented at: 2nd European Microwave Integrated Circuits Conference : EUMA'07, Munich, Germany
See the publication in DTU Orbit See the publication in DTU Orbit

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